@inproceedings{bokaNanolayerMonocrystallineSi2025a,
	location = {Cham},
	title = {Nanolayer of Monocrystalline Si Towards Nanodosimetry of Electron Radiation},
	isbn = {978-3-031-96538-8},
	doi = {10.1007/978-3-031-96538-8_22},
	abstract = {Nanodosimetry aims to measure the ionizing radiation dose absorbed in nanosized volumes. For that, photothermostimulated exoelectron emission ({PTSE}) of monocrystalline silicon (Si) nanolayer might be used to detect weak electrons, because their mean free path in the solid is around 100 nm. The current work aims to explore the possibility of using monocrystalline Si for nanodosimetry of high energy electron radiation. It is demonstrated that the {PTSE} of monocrystalline Si can be used for the identification of 6 {MeV} electron radiation doses 35–60 Gy. The total emitted charge of {PTSE} is connected with the delivered dose. The near-threshold photoelectric emission spectroscopy and Fourier-transform infrared spectroscopy ({FTIR}) indicate that {PTSE} is influenced by radiation-induced reconstructions.},
	pages = {267--277},
	booktitle = {Joint 20th Nordic-Baltic Conference on Biomedical Engineering \& 24th Polish Conference on Biocybernetics and Biomedical Engineering},
	publisher = {Springer Nature Switzerland},
	author = {Boka, Gaļina and Dekhtyar, Yuri and Rocca, Mirko and Skrebele, Elizabete and Sorokins, Hermanis},
	editor = {Ladyzynski, Piotr and Pijanowska, Dorota G. and Liebert, Adam},
	date = {2025},
	langid = {english},
	keywords = {Exoelectron emission, High energy electron radiation, Monocrystalline silicon, Nanodosimetry, scientific-publication},
}