%0 Conference Paper
%T Nanolayer of Monocrystalline Si Towards Nanodosimetry of Electron Radiation
%C Cham
%I Springer Nature Switzerland
%P 267-277
%@ 978-3-031-96538-8
%X Nanodosimetry aims to measure the ionizing radiation dose absorbed in nanosized volumes. For that, photothermostimulated exoelectron emission (PTSE) of monocrystalline silicon (Si) nanolayer might be used to detect weak electrons, because their mean free path in the solid is around 100 nm. The current work aims to explore the possibility of using monocrystalline Si for nanodosimetry of high energy electron radiation. It is demonstrated that the PTSE of monocrystalline Si can be used for the identification of 6 MeV electron radiation doses 35–60 Gy. The total emitted charge of PTSE is connected with the delivered dose. The near-threshold photoelectric emission spectroscopy and Fourier-transform infrared spectroscopy (FTIR) indicate that PTSE is influenced by radiation-induced reconstructions.
%G en
%B Joint 20th Nordic-Baltic Conference on Biomedical Engineering & 24th Polish Conference on Biocybernetics and Biomedical Engineering
%A Boka, Gaļina
%A Dekhtyar, Yuri
%A Rocca, Mirko
%A Skrebele, Elizabete
%A Sorokins, Hermanis
%E Ladyzynski, Piotr
%E Pijanowska, Dorota G.
%E Liebert, Adam
%D 2025
%K Exoelectron emission
High energy electron radiation
Monocrystalline silicon
Nanodosimetry
scientific-publication